Electrostatically actuated encased cantilevers

• Benoit X. E. Desbiolles,
• Gabriela Furlan,
• Adam M. Schwartzberg,
• Paul D. Ashby and
• Dominik Ziegler

Beilstein J. Nanotechnol. 2018, 9, 1381–1389, doi:10.3762/bjnano.9.130

• immersed in a viscous fluid. Quantitative measurements of stiffness, energy dissipation and tip–sample interactions using dynamic force sensors remain challenging due to spurious resonances of the system. Results: We demonstrate for the first time electrostatic actuation with a built-in electrode. Solely

Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate fins

• Gheorghe Stan,
• Richard S. Gates,
• Qichi Hu,
• Kevin Kjoller,
• Craig Prater,
• Kanwal Jit Singh,
• Ebony Mays and
• Sean W. King

Beilstein J. Nanotechnol. 2017, 8, 863–871, doi:10.3762/bjnano.8.88

• widths of 90 nm and 500 nm, respectively. The circled peaks were observed in all the measurements and isolated as spurious resonances. The sample labeling is: (i) after pattern transfer, (ii) after chemical silylation treatment, and (iii) after metallization process flow. Disclaimer Certain commercial

Advanced atomic force microscopy techniques III

• Thilo Glatzel and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2016, 7, 1052–1054, doi:10.3762/bjnano.7.98

• model to derive an accurate and explicit formulae for both conservative and dissipative forces in terms of an arbitrary single harmonic [27], while Luca Costa and Mario S. Rodrigues derived formulas for the tip–sample interactions and investigated the effect of spurious resonances on the measured

Efficiency improvement in the cantilever photothermal excitation method using a photothermal conversion layer

• Natsumi Inada,
• Hitoshi Asakawa,
• Taiki Kobayashi and
• Takeshi Fukuma

Beilstein J. Nanotechnol. 2016, 7, 409–417, doi:10.3762/bjnano.7.36

• of its simple setup and high usability. In the method, a cantilever oscillation is excited by vibrating a piezoelectric actuator integrated in a cantilever holder. However, spurious resonances in the surrounding liquid and mechanical parts often deteriorate the stability and accuracy of AFM

• cantilever oscillation is excited by thermal stress induced by the irradiated laser beam [21]. Owing to the direct excitation of the cantilever, excitation of the spurious resonances is negligible [22]. However, the photothermal excitation method has the disadvantage of low excitation efficiency. Due to the

Influence of spurious resonances on the interaction force in dynamic AFM

• Luca Costa and
• Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

• force microscopy is challenging, especially when measuring in liquid media. Here, we derive formulas for the tip–sample interactions and investigate the effect of spurious resonances on the measured interaction. Highlighting the differences between measuring directly the tip position or the cantilever

• deflection, and considering both direct and acoustic excitation, we show that the cantilever behavior is insensitive to spurious resonances as long as the measured signal corresponds to the tip position, or if the excitation force is correctly considered. Since the effective excitation force may depend on

• the presence of such spurious resonances, only the case in which the frequency is kept constant during the measurement is considered. Finally, we show the advantages that result from the use of a calibration method based on the acquisition of approach–retract curves. Keywords: acoustic excitation

Dynamic calibration of higher eigenmode parameters of a cantilever in atomic force microscopy by using tip–surface interactions

• Stanislav S. Borysov,
• Daniel Forchheimer and
• David B. Haviland

Beilstein J. Nanotechnol. 2014, 5, 1899–1904, doi:10.3762/bjnano.5.200

• , the method should work in liquid or high-damping environments, however, experimental implementation in liquid will suffer from actuation-related effects, squeeze-film damping close to the surface and spurious resonances. [37]. Conclusion We outlined a theoretical framework for experimental calibration

Frequency, amplitude, and phase measurements in contact resonance atomic force microscopies

• Gheorghe Stan and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2014, 5, 278–288, doi:10.3762/bjnano.5.30

• and tip–sample couplings, spurious resonances can mask or distort the real tip–sample coupling resonances [39][40]. On the other hand, in AFAM configuration, the frequency spectra are heavily overwritten by the transfer function of the excitation actuator (underneath the sample), which can provide

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• 2.1 HS-specific artifacts Operating AFMs at high speeds has the potential to generate new distortions not normally observed at conventional speeds. Such artifacts include structural scanner resonances coupling into the sample topography. These sorts of spurious resonances can be observed in piezo tube